Signal generators fall into three basic categories: verification, characterization, and stress/margin testing.
Newly-developed digital-to-analog converters (DAC) and analog-to-digital converters (ADC) must be exhaustively tested to determine their limits of linearity, monotonicity, and distortion. A state-of-the-art AWG can generate simultaneous, in-phase analog and digital signals to drive such devices at speeds up to 1 Gbps.
Engineers working with serial data stream architectures (commonly used in digital communications buses and disk drive amplifiers) need to stress their devices with impairments, particularly jitter and timing violations. Advanced signal generators save the engineer untold hours of calculation by providing efficient built-in jitter editing and generation tools. These instruments can shift critical signal edges as little as 200 fs (0.2 ps).
- Testing Digital Modular Transmitters and Receivers
- Testing D/A and A/D Converters
- Stressing Communication Receivers
Newly-developed digital-to-analog converters (DAC) and analog-to-digital converters (ADC) must be exhaustively tested to determine their limits of linearity, monotonicity, and distortion. A state-of-the-art AWG can generate simultaneous, in-phase analog and digital signals to drive such devices at speeds up to 1 Gbps.
Engineers working with serial data stream architectures (commonly used in digital communications buses and disk drive amplifiers) need to stress their devices with impairments, particularly jitter and timing violations. Advanced signal generators save the engineer untold hours of calculation by providing efficient built-in jitter editing and generation tools. These instruments can shift critical signal edges as little as 200 fs (0.2 ps).
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